Kees Hagen is associate professor at Delft University of Technology. His area of research is microscopy and lithography with charged particles. He co-authored over 120 papers in peer-reviewed journals, a book on electron-beam-induced nanometer-scale deposition, and 2 patents. In 2006 he organized the first International Workshop on Focused Electron-Beam-Induced Deposition Processing (FEBIP) in Delft, served as chairman of the International Steering Committee of the FEBIP workshops till 2022, was co-chair of the EU-COST Action CM1301 CELINA, conference chair of the 41^st International Micro and Nano Engineering conference MNE2015 in the Hague, and is board member of the International Micro and Nano Engineering Society iMNEs.